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SAE AS8018 Minimum Performance Standard for Mach Meters

作者:标准资料网 时间:2024-05-25 04:17:30  浏览:9199   来源:标准资料网
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Product Code:SAE AS8018
Title:Minimum Performance Standard for Mach Meters
Issuing Committee:A-4 Aircraft Instruments Committee
Scope: This AS covers subsonic and supersonic Mach meter instruments which, when connected to sources of static (Ps), and total (Pt), or impact (Pt-Ps), pressure provide indication of Mach number. These instruments are known as Type A. This AS also covers servo-operated repeater or digital display instruments which indicate Mach number when connected to the appropriate electrical output of a Mach transducer of Air Data Computer. These instruments are known as Type B. This Aerospace Standard (AS) specifies the minimum safe performance standards for Mach Meter instruments primarily intended for use in aircraft under standard and environmental conditions.
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【英文标准名称】:TestMethodforTwo-SidedLiquidExtractionofPlasticMaterialsUsingFDAMigrationCell
【原文标准名称】:使用液膜蒸馏器(FDA)移动元件进行塑料制品的双侧液体提取的试验方法
【标准号】:ASTMD4754-1993
【标准状态】:作废
【国别】:美国
【发布日期】:1993
【实施或试行日期】:
【发布单位】:美国材料与试验协会(ASTM)
【起草单位】:ASTM
【标准类型】:()
【标准水平】:()
【中文主题词】:塑料;试验;液体;萃取
【英文主题词】:extraction;liquids;plastics;testing
【摘要】:
【中国标准分类号】:G31
【国际标准分类号】:83_080_00
【页数】:4P;A4
【正文语种】:英语


【英文标准名称】:Mechanicalstandardizationofsemiconductordevices-Part6-3:Generalrulesforthepreparationofoutlinedrawingsofsurfacemountedsemiconductordevicepackages;Measuringmethodsforpackagedimensionsofquatflatpacks(QFP)(IEC60191-6-3:2000);
【原文标准名称】:半导体装置的机械标准化.第6-3部分:表面安装的半导体装置包装外廓图绘制一般规则.包装尺寸测量方法
【标准号】:DINEN60191-6-3-2001
【标准状态】:现行
【国别】:德国
【发布日期】:2001-06
【实施或试行日期】:2001-06-01
【发布单位】:德国标准化学会(DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:电气外壳;力学;元部件;编写;特性;半导体器件;组件;图纸;表面固定装置;外壳;多语种的;盒绘图;定义;定义;连接;电气工程;测量技术;半导体包装;标准化;图例;设计;电子工程;工程图;电子设备及元件;表示法;尺寸;测量;半导体;表面安装
【英文主题词】:Casedrawing;Components;Connections;Definition;Definitions;Design;Dimensions;Drawings;Electricenclosures;Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Enclosures;Engineeringdrawings;Illustrations;Measurement;Measuringtechniques;Mechanic;Multilingual;Properties;Representations;Semiconductordevices;Semiconductorpackage;Semiconductors;Standardization;Surfacemounting;Surfacemountingdevices
【摘要】:Thedocumentstipulatesamethodforquadflatpacks(QFP)measuringdimensionswhichareclassifiedintoFormE.
【中国标准分类号】:H40
【国际标准分类号】:01_100_25;31_240
【页数】:16P.;A4
【正文语种】:德语



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